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Ion beam analysis
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11	SEM Technology Advances Energy Research Add to Reading List Source URL: www.jeolusa.com Language: English - Date: 2013-07-31 11:10:02 Scanning electron microscope Focused ion beam Electron microscope Environmental scanning electron microscope Electron backscatter diffraction Failure analysis Nanoparticle Porosity Microscope Scientific method Science Electron microscopy
12	ANALYSIS OF GYROTROPIC/NON GYROTROPIC ION POPULATIONS IN THE EARTH’S QUASI-PERPENDICULAR ION FORESHOCK: FULL-PARTICLE 2D SIMULATION OF A CURVED SHOCK B. Lemb` Add to Reading List Source URL: physics.bgu.ac.il Language: English - Date: 2014-02-27 14:14:59 Semiconductor device fabrication Thin film deposition Shock wave Ion beam Ion Physics Chemistry Plasma physics
13	Environment Breathing easier: Indonesia works towards cleaner air By Michael Amdi Madsen “In the next three to Add to Reading List Source URL: www.iaea.org Language: English - Date: 2015-04-19 22:22:49 Spectroscopy Air pollution Materials science Particulates Particle-induced X-ray emission Ion beam analysis X-ray fluorescence Pollution Neutron activation analysis Physics Scientific method Science
14	Principal New Research Facilities Light Water Reactor Materials Analysis Station (Second Period) Purpose: This analysis station has been equipped in order to reinforce and evolve microstructural analysis techniques of r Add to Reading List Source URL: criepi.denken.or.jp Language: English - Date: 2010-12-28 01:58:38 Focused ion beam Transmission electron microscopy Electron microscope Scanning electron microscope Microscope Characterization Electron Energy-dispersive X-ray spectroscopy Scanning transmission electron microscopy Scientific method Electron microscopy Science
15	Automated Image Analysis Methods for Characterization and Measurement of Nanomaterials Center for Biological and Environmental Nanotechnology Rice University Add to Reading List Source URL: smartimtech.com Language: English - Date: 2006-01-31 06:16:22 Chemistry Focused ion beam Electron microscope Transmission electron microscopy Scanning electron microscope X-ray photoelectron spectroscopy Characterization Atomic force microscopy Raman spectroscopy Scientific method Science Electron microscopy
16	IAEA-TECDOC[removed]Instrumentation for PIXE and RBS December 2000 Add to Reading List Source URL: www-pub.iaea.org Language: English - Date: 2002-08-20 06:10:35 Nuclear physics Ions Surface chemistry Rutherford backscattering spectrometry Particle-induced X-ray emission Ion beam analysis Electrostatic nuclear accelerator Linear particle accelerator Pelletron Physics Particle accelerators Materials science
17	IAEA-TECDOC-1669 n Integration of Nuclear Spectrometry Methods as a New Approach to Material Research INTERNATIONAL ATOMIC ENERGY AGENCY VIENNA ISBN 978–92–0–121310–5 ISSN 1011–4289 Add to Reading List Source URL: www-pub.iaea.org Language: English - Date: 2012-02-20 08:26:33 Scientific method Spectroscopy International Atomic Energy Agency Nuclear proliferation Ion beam analysis Particle-induced X-ray emission Rutherford backscattering spectrometry SPECTRO Analytical Instruments Characterization Physics Science Materials science
18	Focused Ion Beam Technology and Applications to Microelectronics Add to Reading List Source URL: rs.ieee.org Language: English - Date: 2011-07-27 12:12:51 Semiconductor device fabrication Thin film deposition Physics Failure Focused ion beam Ion beam Fib Failure analysis Electron microscope Scientific method Science Electron microscopy
19	Microsoft Word - XRF newsletter22.doc Add to Reading List Source URL: www-pub.iaea.org Language: English - Date: 2012-02-09 06:02:26 Materials science Spectroscopy SPECTRO Analytical Instruments Microprobe Ion beam analysis XRF Extended X-ray absorption fine structure Rutherford backscattering spectrometry Characterization Scientific method Science Physics
20	XRF Newsletter A newsletter of the IAEA’s Laboratories, Seibersdorf Issue No. 16, December 2008 X ray Fluorescence in the IAEA and its Add to Reading List Source URL: www-pub.iaea.org Language: English - Date: 2008-12-29 11:18:44 Spectroscopy Materials science SPECTRO Analytical Instruments Analytical chemistry X-ray Ion beam analysis Microprobe Extended X-ray absorption fine structure XRF Physics Chemistry Science